Understanding Semiconductors: Modern Metrology from Lab to Fab
Rigaku
Understanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.
Welcome to Understanding Semiconductors!
Categories: Technology
Listen to the last episode:
Ever wondered how atom probe tomography advances our understanding of semiconductors and improves device performance?
In today's episode, we dive deep into the world of semiconductors as we explore the fascinating realm of atom probe tomography. Our guest expert, David Larson, sheds light on the intricacies of this powerful materials characterization technique. From minimizing damage and improving yield to overcoming challenges in data reconstruction, David shares insights on the latest advancements and future possibilities in the field. Tune in to gain a deeper understanding of semiconductors and atom probe technology's role in their analysis.
Join us as we discuss the following:
- The use of a Focused Ion Beam (FIB) at liquid nitrogen temperature to minimize damage and improve yield
- Challenges of yield and spatial distortion in atom probe technology
- How different laser wavelengths can enhance reconstruction and yield in heterogeneous structures
- How modeling and in situ measurements play a crucial role in predicting the field of operation
- The limitations, growth, and future improvements of atom probe technology, including its application in analyzing real devices
To ensure you never miss an episode of the Understanding Semiconductor podcast, subscribe to Apple Podcasts, Spotify, Google, or our website. Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.
Previous episodes
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14 - Semiconductor Secrets Unveiled: Navigating Atom Probe Tomography with David LarsonFri, 08 Dec 2023
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13 - Get to know Semiconductors with Chris Miller, author of the best-selling book, Chip WarTue, 11 Jul 2023
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12 - Filling the Gap in Semiconductors: How to Nurture Ideas into ProductsTue, 28 Feb 2023
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11 - Understanding Transistor Architecture and Scaling with Suman DattaTue, 14 Feb 2023
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10 - What is the Next Big Thing In The Semiconductor Industry? w/ Suman Datta (Part 2)Tue, 06 Dec 2022
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9 - What is the Next Big Thing In The Semiconductor Industry? w/ Suman Datta (Part 1)Tue, 18 Oct 2022
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8 - Dr. Yihung Lin on Machine Learning, Big Data, and Open Platforms: The Future of MetrologyWed, 05 Oct 2022
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7 - Dr. Diebold Returns! A Deep Dive on his thoughts on Near Fab, Lab to Fab and Artificial IntelligenceTue, 20 Sep 2022
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6 - Increased Metrology Means Increased Data. So what Do We Do With It? w/ Alex Liddle - Scientific Director at NISTTue, 06 Sep 2022
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5 - The Essential Role of the Lab in the Semiconductor R&D and Fab, and its Industry ImpactTue, 23 Aug 2022
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4 - Professor Alain Diebold, Ph.D. Successes at SEMATECH, Effective Approach to Metrology Challenges, and Key Takeaways from this 2022 FCMN ConfTue, 09 Aug 2022
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3 - How the Semiconductor Industry can Regain the Hearts and Minds of InnovatorsTue, 26 Jul 2022
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2 - The Increasing Importance of Metrology in the Modern Semiconductor Lab and FabTue, 14 Jun 2022
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1 - Introducing… Understanding Semiconductors! A Rigaku PodcastFri, 03 Jun 2022
